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Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea | 論文著者
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Lee Jo-won
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Kim Chungwoo
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Kim Juhyung
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Kim Moonkyung
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Jeong Younseok
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Yoon Sewook
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Ryu Wonil
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea
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Chae Soodoo
Material and Device Lab., Samsung Advanced Institute of Technology, San 14 Nongseo-ri, Kihung-up, Yongin-si, Kyungki-do, Korea