スポンサーリンク
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan | 論文著者
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Migita Shinji
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan
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Miyata Noriyuki
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan
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Morita Yukinori
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan
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Ota Hiroyuki
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan
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Toriumi Akira
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan
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Yasuda Tetsuji
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba SCR Building, Tsukuba, Ibaraki 305-8569, Japan