スポンサーリンク
Inter-University Semiconductor Research Center (ISRC) and Semiconductor Materials and Devices Laboratory (SMDL), School of Electrical Engineering, Seoul National University, ENG 420-016, Shillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea | 論文著者
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Lee Cheon
Inter-University Semiconductor Research Center (ISRC) and Semiconductor Materials and Devices Laboratory (SMDL), School of Electrical Engineering, Seoul National University, ENG 420-016, Shillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Jung Keum-Dong
Inter-University Semiconductor Research Center (ISRC) and Semiconductor Materials and Devices Laboratory (SMDL), School of Electrical Engineering, Seoul National University, ENG 420-016, Shillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Semiconductor Materials and Devices Laboratory (SMDL), School of Electrical Engineering, Seoul National University, ENG 420-016, Shillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Park Dong-Wook
Inter-University Semiconductor Research Center (ISRC) and Semiconductor Materials and Devices Laboratory (SMDL), School of Electrical Engineering, Seoul National University, ENG 420-016, Shillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Lee Jong
Inter-University Semiconductor Research Center (ISRC) and Semiconductor Materials and Devices Laboratory (SMDL), School of Electrical Engineering, Seoul National University, ENG 420-016, Shillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea