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Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea | 論文著者
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Yongtaek Hong
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Junhee Cho
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Jeong Jaewook
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Kim Sangwoo
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Cho Junhee
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Donghyun Kim
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Jaewook Jeong
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea
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Sangwoo Kim
Inter-University Semiconductor Research Center, Seoul National University, San 56-1, Sillim 9-dong, Gwanak-gu, Seoul 151-744, Korea