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Institute of Microelectronics, Department of Electronic Engineering, Fudan University, 220 Handan Road, Shanghai, 200433, China | 論文著者
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Lin Yin-yin
Institute of Microelectronics, Department of Electronic Engineering, Fudan University, 220 Handan Road, Shanghai, 200433, China
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Tang Ting-ao
Institute of Microelectronics, Department of Electronic Engineering, Fudan University, 220 Handan Road, Shanghai, 200433, China
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Huang Wei-ning
Institute of Microelectronics, Department of Electronic Engineering, Fudan University, 220 Handan Road, Shanghai, 200433, China