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Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China | 論文著者
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Lin Yu-Lu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China
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Liao Chin-I
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China
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Liao Chih-I
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China
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Lin Chien-Lien
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China
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Wang Yeong-Her
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China
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Liao Chin-I.
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, Republic of China