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Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China | 論文著者
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Yu Kuo-Hui
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China
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Chen Tzu-Pin
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China
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Liu Yi-Jung
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China
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Liu Wen-Chau
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China
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Yen Chih-Hung
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China
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Chen Li-Yang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China
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Tsai Tsung-Han
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1, University Road, Tainan, Taiwan 70101, Republic of China