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High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea | 論文著者
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Lim Jong-Won
High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea
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Chang Woo-Jin
High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea
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Ahn Ho-Kyun
High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea
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Ji Hong-Gu
High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea
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Mun Jae-Kyoung
High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea
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Kim Haecheon
High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea