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Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea | 論文著者
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Shin Jae-Heon
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Kwon O-Kyun
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Han Won-Suk
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Yoo Byung-Soo
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Ju Young-Gu
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Kim Jong-Hee
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Hahn Won-Suk
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea
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Roh Jeong-Rae
Electronics and Telecommunications Research Institute, 161 Kajung, Yusung, Taejon 305-350, Korea