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Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea | 論文著者
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Yee Youngjoo
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Kwon Hyouk
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Kim Sun-Ho
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Ha Jong-Min
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Song Ki-Chang
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Um Ki-Young
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Nam Hyo-Jin
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Kim Jin-Hong
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Hong Ki-Myung
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Na Hai-Sub
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Kim Sang-Cheon
Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea