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Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea | 論文著者
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Lee Jeong
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Park Kyu
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Jeong Tae
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Jeong Tae-Hee
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Yeon Cheong
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Seo Hun
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Park Jeong
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Park Jeong-Woo
Devices and Materials Laboratory, LG Corporate Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea