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Devices Laboratory, Materials and Devices Research Center, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-Ri, Giheung-Eup, Yongin-Si, Gyeonggi-Do, Korea | 論文著者
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Park Youngsoo
Devices Laboratory, Materials and Devices Research Center, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-Ri, Giheung-Eup, Yongin-Si, Gyeonggi-Do, Korea
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Shin Sangmin
Devices Laboratory, Materials and Devices Research Center, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-Ri, Giheung-Eup, Yongin-Si, Gyeonggi-Do, Korea
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Kim Sukpil
Devices Laboratory, Materials and Devices Research Center, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-Ri, Giheung-Eup, Yongin-Si, Gyeonggi-Do, Korea
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Koo June-Mo
Devices Laboratory, Materials and Devices Research Center, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-Ri, Giheung-Eup, Yongin-Si, Gyeonggi-Do, Korea