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Department of Microelectronics, Fudan University, Shanghai 200433, China | 論文著者
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Hu Guangda
Department of Microelectronics, Fudan University, Shanghai 200433, China
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Zhong Yu
Department of Microelectronics, Fudan University, Shanghai 200433, China
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Tang Ting-Ao
Department of Microelectronics, Fudan University, Shanghai 200433, China