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Department of Engineering and System Science, Center for Electron Microscopy, National Tsing-Hua University | 論文著者
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HUANG Sen-Hui
Department of Engineering and System Science, Center for Electron Microscopy, National Tsing-Hua University
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KAI Ji-Jung
Department of Engineering and System Science, Center for Electron Microscopy, National Tsing-Hua University
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WANG Wan-Jhih
Department of Engineering and System Science, Center for Electron Microscopy, National Tsing-Hua University
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CHEN Fu-Rong
Department of Engineering and System Science, Center for Electron Microscopy, National Tsing-Hua University