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Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea | 論文著者
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Kwon Hyuk-Min
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Na Min-Ki
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Yoo Ook-Sang
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Sung-Hyung
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Nam Dong-Ho
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Chai Kwang-il
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Choi Kwang-Il
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Byung-Seok
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Choi Won-Ho
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Sung-Soo
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Ga-Won
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Goo Tae-Gyu
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Kim Yong-Goo
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Han In-Shik
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea