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Department of Electronic materials Engineering, Kwangwoon University, Seoul 139-701, Korea | 論文著者
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Kim Jang-Han
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Nam Ki-Hyun
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Kim Se-Ho
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Koh Jung-Hyuk
Department of Electronic materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Won-Ju Cho
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Cho Won-Ju
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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You Hee-Wook
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Park Jin-Kwon
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Jun-Seok Oh
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Chung Hong-Bay
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Jang Hyun-June
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Bae Tae-Eon
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Kim Kwan-Su
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Kim Jin-Woo
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Lee Se-Won
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Lee In-Kyu
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Gu Ja-gyeong
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea