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Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea | 論文著者
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Kim Hyung-Jun
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Kim Young-Hwan
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Kim Byoung-Yong
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Lee Jong-Jin
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Seo Dae-Shik
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Kang Young-Gu
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Park Hong-Gyu
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea
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Ko Tae
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea