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Department of Electrical Engineering, Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA | 論文著者
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Alterovitz Samuel
Department of Electrical Engineering, Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA
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Rai A.
Department of Electrical Engineering, Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA
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Snyder Paul
Department of Electrical Engineering, Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA
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Merkel Kenneth
Department of Electrical Engineering, Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA
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Woollam John
Department of Electrical Engineering, Center for Microelectronic and Optical Materials Research, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA