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Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands | 論文著者
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Jaber Derakhshandeh
Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands
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Golshani Negin
Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands
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Derakhshandeh Jaber
Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands
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Cees I.
Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands
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Negin Golshani
Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands
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Ryoichi Ishihara
Delft University of Technology, Delft Institute of Microsystems and Nanoelectronics (DIMES), ECTM, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands