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Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea | 論文著者
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Koo Jae-Bon
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea
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Kakkad Ramesh
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea
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Choi Byoung-Deog
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea
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Kim Won-Sik
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea
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So Myeong-Seob
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea
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Mo Yeon-Gon
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea
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Kim Sung-Chul
Advanced Technology Institute, Samsung, Giheung, Yongin, Kyoungki 442-391, Korea