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ULVAC-PHI, Inc. | 論文
- Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy
- Detection of characteristic distributions of phospholipid head groups and fatty acids on neurite surface by time-of-flight secondary ion mass spectrometry
- Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
- Site-Selective Analysis of Local Electronic Structures in GaAs_P_x Alloy Semiconductors by Auger Valence Electron Spectroscopy
- XHV System for Surface Analysis Using a New Getter to Reduce Hydrogen
- A Practical Method for Determining Minimum Detectable Values in Pulse-Counting Measurements