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Som Japan Inc. | 論文
- XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal and Ceramics Surfaces
- Surface Analysis of YBa_2Cu_3O_x and Bi-Sr-Ca-Cu-O Superconductors by Auger Electron Spectroscopy
- Effects of Water on the Resistance-Temperature Characteristics of YBa_2Cu_3O_ Oxides : Electrical Properties of Condensed Matter
- Effects of Preparation conditions and Mechanical Polishing on the Superconducting Behavior of High-T_c Oxide Y_1Ba_2Cu_3O_
- Direct Comparison of Fine Structure on Ti L_3 Threshold by Disappearance Potential and Auger Electron and Soft X-Ray Appearance Potential Spectroscopies
- Crystal Growth of Bi-Sr-Ca-Cu-O (c_0=39Å) Single Crystals
- Off-Angle SiC(0001) Surface and Cu/SiC Interface Reaction
- LEED-AES and XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal Surfaces
- Surface of Bi_2Sr_2CaCu_2O_y Single Crystals Heated in Air
- Growth of Bi_2Sr_2CaCu_2O_y Single Crystals Using a Vertical Bridgmam Method
- Focus on metabolic syndrome trends using SOM (特集 生体情報解析と複雑系科学)
- X-Ray Photoelectron Spectroscopy Studies of 7 K-Phase Bi-System Single Crystals
- The Comparison of the Background Removal Methods in XPS Spectra
- XPS Studies of 80 K-Phase Bi-Sr-Ca-Cu-O Single Crystals
- LEED-AES Observations of 7 K- and 80 K-phase Bi-Sr-Ca-Cu-O Single Crystals
- A Micro-Quantitative AES Analysis Using SEM-SAM Apparatus : Applied to Ag/Si Interfaces on Si(111) and Si(100) Surfaces
- Effect of O^+_2 and O^+ on the Growth of Bi_2Sr_2Ca_Cu_nO_y Superconductimg Films in RF Magnetron Sputtering
- Effects of He Gas Addition on the Production of Active Particles in rf Magnetron Sputtering
- Optimization of Contact Process with Monte Carlo Study for Advanced CMOS Devices
- Optimization of Contact Process with Monte-Carlo Study for Advanced CMOS Devices