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Semiconductor Leading Edge Technol. Inc. Yokohama Jpn | 論文
- High-Efficiency Excitonic Emission with Deep-Ultraviolet Light from (001)-Oriented Diamond p-i-n Junction
- Photoconductive Plastic Holography Employing White-Light Laser : Optics and Quantum Electronics
- Electron-Beam-Induced Selective Thermal Decomposition of Ultrathin SiO_2 Layers Used in Nanofabrication
- n-Type Control by Sulfur Ion Implantation in Homoepitaxial Diamond Films Grown by Chemical Vapor Deposition
- High-Quality B-Doped Homoepitaxial Diamond Films using Trimethylboron
- Influence of Biased Electrode on Plasma Confinement in the Tohoku University Heliac
- Particle Transport Study with an Electron Beam in the Tohoku University Heliac
- Potential Structure Measurements of ECH Plasma in a Helical Axis Stellarator
- Measurement of Semiconductor Heterojunction Band Discontinuities Using Free Electron Laser
- Measurement of Semiconductor Heterojunction Band Discontinuity by Free Electron Laser
- Measurement of Band Discontinuity at ZnSe/GaAs Boundary Using Free Electron Laser
- Free Electron Laser Annealing of Amorphous Silicon Carbide
- High performance 0.2μm Dual Gate Complementary MOS Technologies by Suppression of Transient-Enhanced-Diffusion using Rapid Thermal Annealing
- Preparation of Ferroelectric Thin Films of Bismuth Layer Structured Compounds
- Depolarization Characteristics in Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Characteristics of Bismuth Layered SrBi_2Ta_2O_9 Thin-Film Capacitors and Comparison with Pb(Zr, Ti)O_3
- Origin of Depolarization in Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Characteristic Change Due to Polarization Fatigue of Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Polarization Fatigue Characteristics of Sol-Get Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Evaluation of Imprint Properties in Sol-Get Ferroelectric Pb(ZrTi)O_3 Thin-Film Capacitors