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Ntt Basic Research Laboratories | 論文
- Low-dislocation AlGaN thin films grown using Al_Si_xN nano-disks (x=0.07-0.17)
- Strained Thick p-InGaN Layers for GaN/InGaN Heterojunction Bipolar Transistors on Sapphire Substrates
- Nonequilibrium Noise in the Current Flowing through Modulation-Doped Double-Barrier Resonant Tunneling Structures
- Resist Thinning Effect on Nanometer-Scale Line-Edge Roughness : Instrumentation, Measurement, and Fabrication Technology
- A New Approach to Reducing Line-Edge Roughness by Using a Cross-Linked Positive-Tone Resist
- Novel Proximity Effect Including Pattern-Dependent Resist Development in Electron Beam Nanolithography
- Sub-10-nm Si Lines Fabricated Using Shifted Mask Patterns Controlled with Electron Beam Lithography and KOH Anisotropic Etching
- Fabrication of One-Dimensional Silicon Nanowire Structures with a Self-Aligned Point Contact
- Magnetopiezoresistance effects in an InAs/AlGaSb nanomechanical resonator with extremely small power consumption
- DC-Resistive-Heating-Induced Step Bunching on Vicinal Si (111)
- Natural Superstep Formed on GaAs Vicinal Surface by Metalorganic Chemical Vapor Deposition
- NTT乳幼児音声データベースの構築(言語とコーパス,思考と言語一般)
- マイクロディスクアレイ電極によるフェムトモルオ-ダ-のアセチルコリンの検出
- 分子テンプレ-トで修飾した電極によるカテコ-ル,カテコ-ルアミン類の選択的検出
- Sn-Sb-Se/Sb-Bi Bilayer Phase-Change Media for High-Density Write-Once Optical Recording
- Analysis of Leading Edge/Trailing Edge Independent Detection Method in Optical Disk : High Density Recording
- Analysis of Leading Edge/Trailing Edge Independent Detection Method in Optical Disk
- Studies on MOSFET Low-Frequency Noise for Electrometer Applications
- 「特集 : 視覚特徴の統合と選択」編集にあたって
- Thermodynamic Properties of Superconducting YBa_2(Cu_M_x)_3O_ (M=Zn and Ni) Studied by Reversible Magnetization Measurements