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Niigata Univ. Niigata‐shi Jpn | 論文
- A Proposal of Four-Component Scattering Model for Polarimetric SAR Image Decomposition
- Unsupervised Land Cover Classification Using H/α^^-/TP Space Applied to POLSAR Image Analysis(Sensing)
- Distribution of the Received Voltage's Phases in the Cross-Polarized Channel Case
- The Periodicity of the Scattering Matrix and Its Application
- Polarimetric SAR Interferometry for Forest Analysis Based on the ESPRIT Algorithm(Special Issue on New Technologies in Signal Processing for Electromagnetic-wave Sensing and Imaging)
- Compound Scattering Matrix of Targets Aligned in the Range Direction
- Three-Dimensional Fully Polarimetric Imaging in Snowpack by a Synthetic Aperture FM-CW Radar(Special Issue on Advances in Radar Systems)
- Classification of Target Buried in the Underground by Radar Polarimetry
- Optimal Problem for Contrast Enhancement in Polarimetric Radar Remote Sensing
- Stable Decomposition of Mueller Matrix
- The Formulae of the Characteristic Polarization States in the Co-Pol Channel and the Optimal Polarization State for Contrast Enhancement
- BS-7-37 An Experimental Analysis of Intermittent Connectivity in Delay Tolerant Networks(BS-7. Network Planning, Control and Management)
- Analysis of Mean Waiting Time for Delivery of a Message in Mobile Multi-Hop Networks
- Characterization of Minimum Route MTM in One-Dimensional Multi-Hop Wireless Networks
- Characterization of Minimum Route ETX in Multi-Hop Wireless Networks
- Theoretical Analysis of Route Expected Transmission Count in Multi-Hop Wireless Networks
- Analysis and Relative Evaluation of Connectivity of a Mobile Multi-Hop Network
- Performance Evaluation of CDMA Adaptive Interference Canceller with RAKE Structure Using Developed Testbed in Multiuser and Multipath Fading Environment (Special Section on Spread Spectrum Techniques and Applications)
- Performance Evaluation on Power Control and Diversity of Next-Generation CDNA System(Special Issue on Third Generation Land Mobile Communication Systems)
- Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design