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National Institute For Research In Inorganec Materials | 論文
- Magnetization and Spin Correlation of Two-Dimensional Triangular Antiferromagnet LuFe_2O_4
- Optical Constants of TiC_, VC_ and NbC_ from 0.8 to 80 eV
- Hardness and Oxidation Resistance of Perovskite-type Solid Solution of the ScRh_3B-ScRh_3C System
- Ultrasonic Investigation of a Two-Dimensional Triangular Lattice Ferrimagnet, ErFe_2 O_ Single Crystal
- Boron-Carbon Atomic Ratio Dependence on the Hardness and Oxidation Resistance of Solid Solutions of Perovskite-Type Borocarbide YRh_3B_xC_ (O ≦ x ≦ 1)
- NMR Study on the Spin Structure of CeB_6
- NMR Study of a Valence Fluctuating Compound SmB_6
- Preparation of (La, Ce)B_6 Single Crystals by the Traveling Solvent Floating Zone Method
- Charge Frustration and Dielectric Dispersion in LuFe_2O_4 : Condensed Matter: Electronic Properties, etc.
- Observation of the interaction of vortices with dislocations in a Nb superconductor by a cryo-Lorentz EM
- High-Resolution Transmission Electron Microscopy of Long-Period Structures of Various Phases in a Bi-Sr-Cu-O System
- High-Resolution Electron Microscopy of Modulated Structure in 20 K Superconducting Oxide Bi_2Sr_2CuO_y : Electrical Properties of Condensed Matter
- High Resolution Electron Microscopy of Intergrowth and Modulated Structure in 100 K High-T_c Superconductor Bi_2 (Sr,Ca) _4Cu_3O_y : Electrical Properties of Condensed Matter
- Twins and Intergrowth Defects in High-T_c Bi-Sr-Ca-Cu-O Superconductor Examined by High-Resolution Electron Microscopy : Electrical Properties of Condensed Matter
- Identification of the Superconducting Phase in the Bi-Ca-Sr-Cu-O System : Electrical Properties of Condensed Matter
- Electron Diffraction and Microscope Study of Ba-Nd-Cu-O Superconducting Oxides and Related Compounds
- Crystal Structure of the Superconductor Ba_Nd_Cu_3O_
- Surface Phonon of MgO Layer on TiC(100) Surface
- DV-Xα Calculations of Charge Exchange between D^+ and TiC, TiC_xO_, and SrO Surfaces during Low Energy D^+ Scattering
- Interaction Potential between He^+ and Ti in a keV Range as Revealed by a Specialized Technique in Ion Scattering Spectroscopy