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NTT Basic Research Laboratory | 論文
- カスプ磁場におけるプラズマ
- InAs-GaAs Interdiffusion Measurements (TR-IA 7号機特集)
- Magnetic and Superconducting Properties of Ba_2HoCu_3O_ under High Magnetic Field : Electrical Properties of Condensed Matter
- Temperature- and Field-Induced First-Order Ferromagnetic Transitions in MnFe(P_Ge_x)(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Creep Fracture Analysis of W Strengthened High Cr Steel Weldment
- Microstructural Investigations on Type IV Cracking in a High Cr Steel
- Softening of Magnetic Excitations Leading to Pressure-Induced Quantum Phase Transition in Gapped Spin System KCuCl_3(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
- Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy
- Dynamic Force Microscopy Investigations of C_ Deposited on Si(111) Surface
- The Molecular Arrangements of Alkanethiol Self-Assembled Monolayers on Au(111) Studied by Scanning Tunneling Microscopy
- 28a-Z-3 大型ヘリカル装置(LHD)における粒子軌道のカオス
- Highly Reliable SiO_2 Films Formed by UV-O_2 Oxidation
- Field-Induces Destruction of Heavy Fermion State in URu_2Si_2
- Crystal Structure and Superconductivity in Ba_2Y_Pr_xCu_3O_ : Electrical Properties of Condensed Matter
- Superconductivity in Ba_3La_2LuCu_6O_y : Electrical Properties of Condensed Matter
- Preparation and Superconducting Properties of Tetragonal Ba_2YCu_3O_ and Ba_2EuCu_3O_ with Low Oxygen-Defect Concentration (0.05