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Musashino Electrical Communication Laboratory, NTT | 論文
- 高分子複合物圧電材料を用いたバイモルフ形マイクロホン
- Photo-Deep-Level Fourier Spectroscopy in Semi-Insulating Bulk Materials
- Surface Microtopography and Compositional Change of Cesium-Ion-Bombarded Semiconductor Surfaces
- Si and Sn Doping in Al_xGa_As Grown by MBE
- (InAs)_1(GaAs)_1 Layered Crystal Grown by MOCVD
- 高分子圧電材料を用いた平板スピーカの多重共振系としての検討
- Electrical Characterization of Micro Defects in Silicon Crystal : C-3: CRYSTAL TECHNOLOGY
- Stacking Faults from Oxide Precipitates in CZ Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
- Growth of Stacking Faults by Bardeen-Herring Mechanism in Czochralski Silicon
- Deep Level Fourier Spectroscopy for Determination of Deep Level Parameters
- In_xGa_As Injection Lasers
- Study on Spherical Foil Bearing : 1st Report, Analysis for Perfectry Flexible Foil
- Study on Spherical Foil Bearing : 2nd report Analysis including foil bending stiffness and its experimental verification
- Study on Spherical Foil Bearing : 3rd Report, Analysis for Large Bearing Penetration
- Study on Spherical Foil Bearing : 4th Report, Comparison between Experiment and Analysis for Large Bearing Penetration
- Impurity Effect on Interface Morphology of AlGaAs LPE on Corrugated GaAs Substrates
- SAW Device Application to Public Telecommunication System in Japan
- Analysis of Degradation Behavior of a Gunn Diode Based on the Dislocation Acceptor Theory
- Behavior of the Schottky-Barrier Diode under Uniaxial Stress