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Matsushita Electric Industrial Co. Ltd. Osaka Jpn | 論文
- Nondestructive and Contactless Monitoring Technique of Si Surface Stress by Photoreflectance
- Non-Destructive and Contactless Monitoring Technique of Si Surface Stress by Photoreflectance
- Optical Characterization of Gate Oxide Charging Damage by Photoreflectance Spectroscopy
- Optical Characterization of Gate Oxide Charging Damage by Photoreflectance Spectroscopy
- Modeling Thermal Diffusion of Scanned and Focused Laser Power on Direct Overwrite Magneto-Optical Disk
- Voltage-Dependence of Scanning Tunneling Microscopy on Titanium Surface in Air
- Fabrication Process of Color Filters Using Pigmented Photoresists
- Polymer Optimization of Pigmented Photoresists for Color Filter Production
- Bond Length Relaxation in Ultrathin InAs and InP_As_ Layers on InP(001)
- Local Structure of CuInSe_2 Thin Film Studied by EXAFS
- EXAFS Studies on (Cu, In)Se_2
- Migration-Enhanced Epitaxy of GaAs and AlGaAs
- Low-Temperature Growth of GaAs and AlAs-GaAs Quantum-Well Layers by Modified Molecular Beam Epitaxy
- Phenomenological Interpretation of Excimer Laser Ablation of Single-Crystal Oxides (MgO, SrTiO_3 and LaAlO_3)
- Surface Observation and Modification of Si Substrate in NH_4F and H_2SO_4 Solutions
- Surface Observation and Modification of Si Substrate in Solutions
- Electrochemical Scanning Tunneling Microscopy and Atomic Force Microscopy Observationson Si(111) in Several Solutions
- Vertical-Cavity Surface-Emitting Lasers with Stable Polarization Grown on (411)A-Oriented GaAs Substrates
- Second-Harmonic Generation in Vertical-Cavity Surface-Emitting Laser
- Rewritable Dual-Layer Phase-Change Optical Disk with a Balanced Transmittance Structure