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Lucent Technologies Bell Laboratories | 論文
- Document Image Compression by Nonlinear Binary Subband Decomposition and Concatenated Arithmetic Coding
- Scanning Single Electron Transistor Microscopy : Imaging Individual Charges
- 透過型電子顕微鏡によるめっき膜中の混入不純物の観察
- Efficient Representation and Compression of Multi-View Images
- UHV-STM Nanofabrication and Semiconductor Interface Characterization : Transitions to CMOS Technology
- Electron Scattering and Related Phenomena in Scattering with Angular Limitation Projection Electron Lithography(SCALPEL)
- めっき被膜への不純物共析
- Organic Transistors for Logic and Flexible Display Applications