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JEOL Ltd | 論文
- Measurement of electric potential distributions around FEG-emitters by electron holography
- A new method for detecting and localizing cell markers endocytosed by fibroblasts in epoxy resin semi-thin sections using scanning electron microscopy combined with energy dispersive X-ray microanalysis after ion-etching
- Magnification and scanning time dependence of secondary electron image contrast of ferroelectric domains in aged triglycine sulphate crystal
- Static capacitance contrast of LSI covered with an insulator film in low accelerating voltage scanning electron microscope
- Arabidopsis control the concentration of an active oxygen species by ascorbic acid and anthocyanin
- Scanning Tunneling Microscopy of Clean Silicon Surfaces at Elevated Temperatures
- A New Technique for the Preparation of Clean Surface of Brasses by Scratching
- Non-isochromaticity of an omega filter in a 200 kV transmission electron microscope
- Design and testing of Omega mode imaging energy filters at 200 kV
- Application of a New Sample Introduction System for FAB Mass Spectrometry
- Modified Solvent System for Reversed-Phase Liquid Chromatography/Mass Spectrometry
- Initialization by erasing the surface potential of negatively charged insulators in scanning electron microscope (SEM) observation
- Optical design of electron microscope lenses and energy filters
- Development of a magnetizing stage for in situ observations with electron holography and Lorentz microscopy
- Direct Observation of Vacancies and Local Thermal Vibration in Thermoelectric Rhenium Silicide
- Observation of Element-Specific Energy-Filtered X-Ray Photoemission Electron Microscopy Images of Au on Ta Using a Wien Filter Type Energy Analyzer
- Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy
- Performance of a Focused-Ion-Beam Implanter with Tilt-Writing Function