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JEOL Ltd | 論文
- Low-Temperature Electron Microscopy of a Bi_2(Sr, Ca)_3Cu_2O_x Superconductor
- III G9 Ascorbyl radical generation in the mouse hippocampus during kainate-induced seizures : An electron spin resonance(ESR)study
- Direct imaging of Guinier-Preston zones by high-angle annular detector dark-field scanning transmission electron microscopy
- Evaluation of the characteristics of a slow-scan CCD camera for a transmission electron microscope
- Detective quantum efficiency of the 25 μm pixel size Imaging Plate for transmission electron microscopes
- Sensitivity and Fading Characteristics of the 25μm Pixel Size Imaging Plate for Transmission Electron Microscopes
- Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope
- Experimental evaluation of a spherical aberration-corrected TEM and STEM
- Effect of Scattering Angle on Energy Loss Near-Edge Structure of h-BN
- A spherical aberration-corrected 200kV TEM
- First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM
- Electronic structure changes associated with a martensitic transformation in a Ti_Ni_Fe_2 alloy studied by electron energy-loss spectroscopy
- Quantification of Oxygen Vacancies in Parasite using a 300 kV HREM with an Imaging Plate
- New Electron Diffraction Techniques Using Electronic Hollow-Cone Illumination
- Scanning Tunneling Microscopy Study of the 16-Structure Appearing on a Si(110) Surface
- Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
- Observation of Silicon Surface Using Ultrahigh Vacuum Noncontact Atomic Force Microscope
- A practical method for the remote control of the scannig electron microscope
- High Magnification Observation of Magnetic Domains by Means of a High Voltage Scanning Electron Microscope