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Inter-university Semiconductor Research Center (ISRC), Seoul National University | 論文
- A Study on Therlnal Stability of CoSi_2 Elnploying Novel Flne-Gralned PolycryStalline Silicon/CoSi_2/Si (001) System : Semiconductors
- Charge Injection Path of Bottom-Contact Organic Thin-Film Transistors(Session4B: Emerging Devices II)
- Charge Injection Path of Bottom-Contact Organic Thin-Film Transistors(Session4B: Emerging Devices II)
- An Analytic Current-Voltage Equation for Top-contact OTFTs Including the Effects of Variable Series Resistance