スポンサーリンク
Institute of Space and Astronautical Science, 3-1-1 Yoshinodai, Sagamihara 229-8510, Japan | 論文
- Radiation Hardness of the Notch Structure Inside the Charge-Coupled Device
- Comparison of Silicon-on-Insulator Wafer Mappings between Photoluminescence Intensity and Microwave Photoconductivity Decay Lifetime