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Graduate School of Engineering, Toyama University | 論文
- Effect of Microstructure on Creep and Creep-Fatigue behavior in Ti-6Al-4V Alloy at Elevated Temperature
- BS-9-14 K-factor Dependent Multipath Characterization for BAN-OTA Testing Using a Fading Emulator
- BS-8-8 BAN-OTA Testing Using a Fading Emulator with a Dynamic Phantom