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Electrotechnical Laboratory, National Institute of Advanced Industrial Science and Technology | 論文
- Improved Quantum Hall Standard of Resistance at Electrotechnical Laboratory(General Physics)
- Resistance Ratio Bridge Using Cryogenic Current Comparator with DC-Superconducting Quantum Interference Device Magnetometer
- Determination of the Fine Structure Constant Based on the Quantum Hall Effect
- Quantized Hall Resistivity in Si-MOSFETs Measured at Liq.^3He Temperatures
- Piezoresistance and Piezo-Hall Effect in Heavily Doped n-Type Silicon
- Magnetic Anomaly in the Metallic Impurity Conduction
- Piezoresistance and Magnetic Susceptibility in Heavily Doped n-Type Silicon
- Improved Fabrication Method of the Microbridge Utilizing Step Edge
- Fabrication of the Weak-Link Josephson Junction on a Microstep
- Far-Infrared Photoconductivity in Phosphorus Doped n-Type Silicon in the Intermediate Impurity Concentration Region under Uniaxial Compressional Stress
- Integrated DC-SQUID Magnetometer
- DC Superconducting Quantum Interference Device Magnetometer for Cryogenic Current Comparator