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Department of Physics (M/C 273), University of Illinois at Chicago | 論文
- Application of atomic scale STEM techniques to the study of interfaces and defects in materials
- Atomic resolution Z-contrast imaging of semiconductors
- Demonstration of atomic resolution Z-contrast imaging by a JEOL JEM-2010F scanning transmission electron microscope
- High-Quality Epitaxial MnSi(111) Layers Grown in the Presence of an Sb Flux