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Department of Geology, Faculty of Science, Kochi University | 論文
- Surgical Strategy for Spinal Metastases
- In-situ Measurement of Temperature Variation in Si Wafer During Millisecond Rapid Thermal Annealing Induced by Thermal Plasma Jet Irradiation
- Melting and Solidification of Microcrystalline Si Films Induced by Semiconductor Diode Laser Irradiation
- Application of Plasma Jet Crystallization Technique to Fabrication of Thin-Film Transistor
- Characterization of Interfacial Oxide Layers in Heterostructures of Hafnium Oxides Formed on NH_3-Nitrided Si(100)
- Impact of Rapid Thermal O_2 Anneal on Dielectric Stack Structures of Hafnium Aluminate and Silicon Dioxide Formed on Si(100)
- Spontaneous Occlusion of Ruptured Vertebral Artery Dissection at the Extradural Fenestration Associated with Extradural Origin of the Posterior Inferior Cerebellar Artery : Case Report
- Occlusive Cerebrovasculopathy after Internal Radiation and Bleomycin Therapy for Craniopharyngioma : Case Report
- Successful Removal of Meningioma of the Pineal Region after Embolization
- Cerebellar Infarction with Hydrocephalus Caused by Spontaneous Extracranial Vertebral Artery Dissection : Case Report
- Overcoming the Immune Response to Permit Ex Vivo Gene Therapy for Spine Fusion With Human Type 5 Adenoviral Delivery of the LIM Mineralization Protein-1 cDNA
- Delivery of Recombinant Human Bone Morphogenetic Protein-2 Using a Compression-Resistant Matrix in Posterolateral Spine Fusion in the Rabbit and in the Non-Human Primate
- Differential Regulation of MMP-9 and TIMP-2 Expression in Malignant Melanoma Developed in Metallothionein/RET Transgenic Mice
- Electrokinetic phenomena associated with a water injection experiment at the Nojima fault on Awaji Island, Japan
- Multiple-Step Electron Charging in Silicon-Quantum-Dot Floating Gate Metal-Oxide-Semiconductor Memories
- Carrier Depletion Effect in the n^+Poly-Si Gate Side-Wall/SiO_2 Interfaces as Evaluated by Gate Tunnel Leakage Current : Semiconductors
- Memory Operation of Silicon Quantum-Dot Floating-GateMetal-Oxide-Semiconductor Field-Effect Transistors : Semiconductors
- Experimental Evidence of Carrier Depletion Effect near n^+Poly-Si Gate Side
- Experimental Evidence of Carrier Depletion Effect near n^+Poly-Si Gate Side Wall/SiO_2 Interfaces for Sub-100nm nMOSFETs
- Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique