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Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University | 論文
- New Insight into the Degradation Mechanism of Nitride Spacer with Different Post-Oxide in Submicron LDDn-MOSFET's
- Charge Pumping Profiling Technique for the Evaluation of Plasma-Charging-Enhanced Hot-Carrier Effect in Short-N-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
- New Degradation Mechanisms of Width-Dependent Hot Carrier Effect in Quarter-Micron Shallow-Trench-Isolated p-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors
- Reliability Test Guideline for a 0.18μm Generation multi-Oxide CMOS Technology for System-on-Chip Applications
- Parallel Simulation of Ion Implantation for Multi-Component Targets Using Boltzmann Transport Equation