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Department Of Physics And Electronics Gra4uate School Of Engineering Osaka Prefecture University | 論文
- X-ray Absorption Near Edge Structure (XANES) of CuInSe_2, Brass and Phosphor Bronze by Photoacoustic Method : Photoacoustic Spectroscopy
- Photoacoustic EXAFS of Solid Phase
- Long Ni Cantilever Fabrication with New Sacrificial Process
- A Monte Carlo Study of Magnetic Domain Images in a Spin-Polarized Scanning Electron Microscope
- Fabrication of a New Electrostatic Linear Actuator
- Grown-in Microdefects in a Slowly Grown Czochralski Silicon Crystal Observed by Synchrotron Radiation Topography
- In Situ Measurements of the Resist Etch Rate for Submicron Patterns
- Mierodefects in an As-Grown Czoehralski Silicon Crystal Studied by Synchrotron Radiation Section Topography with Aid of Computer Simulation
- Resist Etching with Parellel-Plate RF Plasmas Enhanced by a Cusp Magnetic Field
- Measurement of the Electron Energy Distribution in Asymmetric Radio-Frequency Plasmas with a Self-Compensating Langmuir Probe
- Electrical Properties of Planar RF Discharges Including the Second Harmonic Frequency ( Plasma Processing)
- Observation of Microdefects in As-Grown Czochralski Silicon Crystals by Synchrotron Radiation Topography
- Holographic Lithography with Endpoint Detection of Resist Development
- Numerically Simulated and Experimentally Obtained X-Ray Section Topographs of a Spherical Strain Field in a Floating Zone Silicon Crystal
- Enlargement of Poly-Si Film Grain Size by Excimer Laser Annealing and Its Application to High-Performance Poly-Si Thin Film Transistor
- Synchrotron Radiation Section Topography with Extremely High-Order Reflection and Its Application to the Characterization of MCZ-Silicon Crystals
- Measurement and Analysis of the Static Debye-Waller Factor of Cz-Silicon with Small Oxygen Precipitates : Techniques, Instrumentations and Measurement
- Measurement of the Static Debye-Waller Factor of Silicon Crystals by the Pendellosung Fringe Method
- Laser Patterning Method for Integrated Type a-Si Solar Cell Submodules
- Analysis of Developed Pattern Profiles in X-Ray Lithography with Monochromatic X-Rays