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Department Of Breast And Endocrine Surgery University Of Tokyo | 論文
- Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross-Sectional Area and Inductive Crosstalk Effect(Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)
- Extracting Device-Parameter Variations with RO-Based Sensors
- Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
- Power Distribution Network Optimization for Timing Improvement with Statistical Noise Model and Timing Analysis
- PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices