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Department Of Anatomy And Department Of Plastic And Reconstructive Surgery Faculty Of Medicine Kyoto | 論文
- Long-Time Tail in the Two-Wave Model
- Basic study for the application of antisense strategies to the in vitro culture system of fetal mouse palates : The 35th Annual Meeting of the Japanese Teratology Society
- In-Plane Anisotropy of MOS Inversion Layer Mobility on Silicon (100), (110) and (111) surfaces
- Study of normal and holoprosencephalic human embryos using computer-reconstructed three-dimensional models : Abstracts of Papers Presented at the Thirtieth Annual Meeting of the Japanese Teratology Society Miyazaki, Japan, July 12-13, 1990
- Human conceptus database : Abstracts of Papers Presented at the Thirty-Fourth Annual Meeting of the Japanese Teratology Society Kochi, Japan July14-16, 1994
- Effects of exogenous epidermal growth factor (EGF) on fetal mouse palates cultured in vitro : The 35th Annual Meeting of the Japanese Teratology Society
- Analysis of mechanisms of BrdU-induced limb malformations : The 35th Annual Meeting of the Japanese Teratology Society
- An attempt to apply antisense oligonucleotide inhibition of gene activity to in vitro organ culture of developing tissues : Abstracts of Papers Presented at the Thirty-Fourth Annual Meeting of the Japanese Teratology Society Kochi, Japan July14-16, 1994
- Effects of retinoic acid on fetal mouse palates cultured in vitro : Abstracts of Papers Presented at the Thirty-First Annual Meeting of the Japanese Teratology Society Izumo, Japan, July 11-12, 1991
- Immunohistochemical study of the epidermal growth factor receptor in normal and retinoic acid-treated fetal mouse palates : Abstracts of Papers Presented at the Thirtieth Annual Meeting of the Japanese Teratology Society Miyazaki, Japan, July 12-13, 1990
- Long-Time Correlation in the Two-Wave Hamiltonian
- Immunohistochemical Study on the Expression of Vascular Endothelial Growth Factor Receptor (VEGF Receptor) In the Developing Mouse Kidney : Poster Sessions
- Advanced split-CV technique for accurate extraction of inversion layer mobility in short channel MOSFETs
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