スポンサーリンク
Advanced Research Laboratory, Hitachi Ltd. | 論文
- Characteristics of Nanoscale Lithography Using AFM with a Current-Controlled Exposure System
- Characteristics of Nanoscale Lithography Using Atomic Force Microscope with Current-Controlled Exposure System
- Preparation of YBa_2Cu_3O_ Superconducting Thin Films by RF-Magnetron Sputtering
- X-Ray Computerized Tomography Using Monochromated Synchrotron Radiation : Techniques, Instrumentations and Measurement
- Recorded Magnetization Structures and Noise Characteristics of CoCr Alloy Longitudinal Thin-Film Media
- Control of Surface Current on a Si(111) Surface by Using Nanofabrication
- Theoretical Study of Ga Adsorbates around Dangling-Bond Wires on am H-Terminated Si Surface: Possibility of Atomic-Scale Ferromagnets
- Initial Stage of Molecular Adsorption on Si(100) and H-terminated Si(100) Investigated by UHV-STM(STM-Si(001))
- Scanning Tunneling Spectroscopy of Dangling-Bond Wires Fabricated on the Si(100) -2 × 1 -H Surface
- Property Change of Si(111) Surface by Scanning Tunneling Microscope Manipulation
- Studies on Particle Separation by Acoustic Radiation Force and Electrostatie Force
- Concentration and Fractionation of Small Particles in Liquid by Ultrasound
- Phase Controlled Scanning Force Microscope
- Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8
- X-Ray Absorption Studies of High-T_c YBa_2Cu_3O_x : Condensed Matter
- Precise EXAFS Analysis for High-T_c YBa_2Cu_3O_x : Condensed Matter
- Spin-Polarized Scanning Electron Microscope Equipped with a Thumb-Size Spin Detector : Techniques, Instrumentations and Measurement
- Spin-Polarized Scanning Electron Microscope for Analysis of Complicated Magnetic Domain Structures
- High Spatial Resolution Spin-Polarized Scanning Electron Microscope
- Spin-Polarized Scanning Electron Microscopy