Chen Shang-Jr | Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan

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• Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwanの論文著者

Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan | 論文

• Reliability Test Guidelines for a 0.18 μm Generation Multi-Oxide CMOS Technology for System-on-Chip Applications

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