Kim Dae | School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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- School of Electrical Engineering, Kookmin University, Seoul 136-702, Koreaの論文著者
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea | 論文
- AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter
- Impact of High-$k$ HfO2 Dielectric on the Low-Frequency Noise Behaviors in Amorphous InGaZnO Thin Film Transistors