YOKOTA Yuya | Kyushu University, Fukuoka 816-8580, Japan
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概要
Kyushu University, Fukuoka 816-8580, Japan | 論文
- Simulation Study of Ultrashort-Pulse Reflectometry by Signal Record Analysis
- Impact of Light-Element Impurities on Crystalline Defect Generation in Silicon Wafer (Special Issue : Solid State Devices and Materials (1))