Gotoh Akio | Research Institute of Electrical Communication, Tohoku University, Sendai 980-77, Japan
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- Research Institute of Electrical Communication, Tohoku University, Sendai 980-77, Japanの論文著者
Research Institute of Electrical Communication, Tohoku University, Sendai 980-77, Japan | 論文
- Pattern Selection of Cracks in Directionally Drying Fracture
- Self-Aligned 10-nm Barrier Layer Formation Technology for Fully Self-Aligned Metallization Metal-Oxide-Semiconductor Field-Effect-Transistor