NUKADA Hideki | Corporate Research & Development Center, Toshiba Corporation
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Corporate Research & Development Center, Toshiba Corporation | 論文
- Electronic Structures of (Pb_2Cu)Sr_2Eu_xCe_Cu_2O_ (n = 2, 3) : Effect of Fluorite Blocks between Adjacent CuO_2 Layers (Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties)
- A Spurious Suppression Technique for Fractional-N Frequency Synthesizers
- BD-Type Write-Once Disk with Pollutant-Free Material and Starch Substrate
- High Recording Density Optical Disc Mastering
- Study of Chemically Amplified Resist Using an Electron Beam Recorder