HSU C.-H. | United Microelectronics Corporation, Central R&D Division
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概要
論文 | ランダム
- Reliability of Surface MEMS Structures Fabricated Using Standard CMOS Back-End-Of-Line Processes
- Importance of the Functional Group Density of a Polymeric Gate Insulator for Organic Thin-Film-Transistors
- Pretilt Control of a Nematic Liquid Crystal on Polymer Layers by Atmospheric Plasma Irradiation
- Triplet Pairing Superconductivity Induced by Short-Range Ferromagnetic Correlations in Sr_2RuO_4(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Spin-Triplet Superconductivity Induced by Charge Fluctuations in Extended Hubbard Model(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)