HE Lu | Institute of Microelectronics, Chinese Academy of Sciences
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概要
Institute of Microelectronics, Chinese Academy of Sciences | 論文
- Impacts of Body Contact Structures on SOI NMOSFET DC, RF, and 1/f Noise Characteristics
- 放射線管理用線量測定器の新しい動向 III 環境測定用線量計 III-2 中性子線量当量測定器(レムカウンタ) (1)広帯域中性子レムカウンタ
- Doping Effect of PtCu/Co and PtAl/Co Multilayers
- Nanocables Prepared from Polyamide 66 nanotubes Enveloping Pt nanowires by a Secondary-template Method
- Further Results on the Stopping Distance of Array LDPC Matrices